Custom Checkerboard Calibration Targets for Semiconductor Wafer Inspection
In semiconductor wafer inspection, your measurement is only as accurate as your calibration target. When you’re detecting particles smaller than 50 µm, verifying die placement to micron tolerances, or measuring kerf width after dicing, a standard ±1 µm printed checkerboard isn’t a calibration tool — it’s a source of error. This guide covers why semiconductor […]