Custom Checkerboard Calibration Targets for Semiconductor Wafer Inspection
In semiconductor wafer inspection, your measurement is only as accurate as your calibration target. When you’re detecting particles smaller than 50 µm, verifying die placement to micron tolerances, or measuring kerf width after dicing, a standard ±1 µm printed checkerboard isn’t a calibration tool — it’s a source of error. This guide covers why semiconductor […]
What Is the Best Checkerboard Size for OpenCV Camera Calibration?
If you’ve set up an OpenCV camera calibration pipeline, this question comes up fast: What size checkerboard should I actually use? The short answer is: there’s no single “best” size. The right dimensions depend on your camera, your working distance, and what level of accuracy you need. But there are clear guidelines that most engineers […]