Edge definition to 0.7 µm — photolithographic chrome, sharper than any sensor under test
Calibrated low contrast — controlled-density chrome for ISO 12233 e-SFR edges, no highlight clipping, no sharpening bias
Two optical substrates — soda-lime glass (±1 µm) or fused-silica quartz (±0.5 µm, ~16× more thermally stable)
ISO 12233 e-SFR layout — measures MTF, lateral chromatic aberration and distortion in one capture
Software-ready — works with Imatest (e-SFR ISO / SFRplus) and other slanted-edge SFR tools; registration markers enable automated ROI
Traceable on request — per-unit measured contrast, OD and critical dimensions; CNAS L0579, NIST & NIM traceable