AC: Semiconductor Inspection

Wafer, die and packaging inspection systems need references that are stable at the micron level. Calibvision supplies chrome-on-quartz and chrome-on-glass dot grids, checkerboards and resolution targets with feature position accuracy down to ±0.1 µm, for optics alignment, magnification calibration and stage verification. Every target ships with a measured inspection report, and CNAS certification is available on request.